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Automated High-resolution Inspection and Reverse Engineering of Microelectronics Using Laser and Multimodality Microscopy
Project ID:
P5_23
Principal Investigator:
Dr. Sina Shahbazmohamadi
Email:
Co-Principal Investigator(s):
Dr. Pouya Tavousi
Topic Areas:
Reverse engineering, Counterfeit, overproduction, IP theft detection and deterrence
Abstract
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